Accurate thermal noise model for deep-submicron CMOS

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 155-158

  Scholten, A J ^a   Tromp, H J ^a   Tiemeijer, L F ^a   van Langevelde, R ^a   Havens, R J ^a   de Vreede, P W H ^a   Roes, R F M ^a   Woerlee, P H ^a   Montree, A H ^a   Klaassen, D B M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CMOS INTEGRATED CIRCUITS; FREQUENCIES; GATES (TRANSISTOR); MOSFET DEVICES; THERMAL EFFECTS; THERMAL NOISE;

CARRIER HEATING EFFECTS; CMOS TECHNOLOGY; DRAIN CURRENT THERMAL NOISE; INTERMEDIATE FREQUENCIES; THERMAL NOISE MODEL; VELOCITY SATURATION;

SEMICONDUCTOR DEVICE MODELS;

EID: 0033314182     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)