Noise modeling for RF CMOS circuit simulation

IEEE Transactions on Electron Devices

Volumn 50, Issue 3, 2003, Pages 618-632

  Scholten, Andries J ^a   Tiemeijer, Luuk F ^a   Van Langevelde, Ronald ^a   Havens, Ramon J ^a   Zegers Van Duijnhoven, Adrie T ^a   Venezia, Vincent C ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

1 f noise; Avalanche noise; Compact modeling; Flicker noise; Induced flicker noise; Induced gate noise; MOSFET; Noise; RF CMOS; Shot noise; Thermal noise

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; DIELECTRIC MATERIALS; GATES (TRANSISTOR); LEAKAGE CURRENTS; MOSFET DEVICES; PHONONS; SHOT NOISE; SIGNAL NOISE MEASUREMENT; THERMAL NOISE;

AVALANCHE CURRENT; AVALANCHE NOISE; CHANNEL SEGMENTATION; DRAIN CURRENT NOISE; FLICKER NOISE; GATE CURRENT NOISE;

CMOS INTEGRATED CIRCUITS;

EID: 0037560945     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.810480     Document Type: Article

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