메뉴 건너뛰기




Volumn 18, Issue 2, 2000, Pages 757-760

Direct extraction of the channel thermal noise in metal-oxide-semiconductor field effect transistor from measurements of their rf noise parameters

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR JUNCTIONS; THERMAL NOISE; TRANSCONDUCTANCE;

EID: 0034155692     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582174     Document Type: Article
Times cited : (11)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.