Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements

IEEE Transactions on Electron Devices

Volumn 48, Issue 12, 2001, Pages 2884-2892

  Chen, Chih Hung ^a,b   Deen, M Jamal ^a,b   Cheng, Yuhua ^a,c   Matloubian, Mishel ^a,c  

^a IEEE   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

^c Rockwell Semiconductor Systems   (United States)

Author keywords

Channel noise; Cross correlation noise; Induced gate noise; Noise of MOSFETs; RF noise extraction

Indexed keywords

CHANNEL NOISE; GATE NOISE;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CORRELATION METHODS; FREQUENCIES; GATES (TRANSISTOR); SPURIOUS SIGNAL NOISE;

MOSFET DEVICES;

EID: 0035691643     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.974722     Document Type: Article

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