High frequency noise of MOSFETs I modeling

Solid-State Electronics

Volumn 42, Issue 11, 1998, Pages 2069-2081

  Chen, C H ^a   Deen, M J ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SIGNAL NOISE MEASUREMENT; THERMAL NOISE;

DEVICE UNDER TEST (DUT);

MOSFET DEVICES;

EID: 0032206938     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00192-0     Document Type: Article

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