Modelling of bonding pads and their effect on the high-frequency-noise figure of polysilicon emitter bipolar junction transistors

Canadian Journal of Physics

Volumn 74, Issue , 1996, Pages

  Deen, M J ^a   Ilowski, J ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000445144     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/p96-859     Document Type: Article

References (7)

1. R.J. Hawkins. Solid-State Electron. 20, 191 (1977).
2. M.J. Deen and J.J. Ilowski. Electron. Lett. 29, 676 (1993).
3. M.J. Deen and J.J. Ilowski. AIP Conf. Proc. 285, 216 (1993).
4. M.J. Deen and J.J. Ilowski. In Proceedings of the 13th International Conference on Noise in Physical Systems and 1/fFluctuations (ICNF '95). Edited by V. Bareikis and R. Katilius. World Scientific Publishing, Singapore. 1995. pp. 458-461.
5. M.J. Deen. Can. J. Phys. (Suppl.), 74, (1996). This issue.
6. M.J. Deen. Proc. 8th Asia-Pacific Microwave Conf. (APMC '96). Edited by R.S. Gupta. New Delhi, India. 1996. pp. 551-552.
7. M.J. Deen. Proc 1st. Int. Conf. Unsolved Problems on Noise (UPON '96). Edited by L. Kiss. World Scientific Publishing, Singapore. 1996.