RF-noise of deep-submicron MOSFETs: Extraction and modeling

European Solid-State Device Research Conference

Volumn , Issue , 2001, Pages 331-334

  Knoblinger, Gerhard ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP SUB-MICRON; MOSFETS; RF-NOISE;

EID: 84907552379     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2001.195268     Document Type: Conference Paper

References (9)

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