Channel noise modeling of deep submicron MOSFETs

IEEE Transactions on Electron Devices

Volumn 49, Issue 8, 2002, Pages 1484-1487

  Chen, Chih Hung ^a   Deen, M Jamal ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Channel length modulation; Channel noise of deep submicron MOSFETs; Diffusion noise; High frequency noise modeling; Thermal noise

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; THERMAL NOISE; VOLTAGE MEASUREMENT;

CHANNEL LENGTH MODULATION; CHANNEL NOISE; HOT ELECTRON EFFECT; SPECTRAL DENSITIES;

MOSFET DEVICES;

EID: 0036683922     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.801229     Document Type: Article

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