D.C. scanning thermal microscopy: Characterisation and interpretation of the measurement

International Journal of Thermal Sciences

Volumn 40, Issue 11, 2001, Pages 949-958

  Gomes, Séverine ^a   Trannoy, Nathalie ^a   Grossel, Philippe ^a   Depasse, Françoise ^a   Bainier, Claudine ^b   Charraut, Daniel ^b  

^a U de Thermique et d'Anal Physique   (France)

^b FEMTO ST INSTITUTE   (France)

Author keywords

Scanning thermal microscopy; Thermal conductivity; Thermal contact; Thermal coupling; Thermal probe; Tip sample interaction

Indexed keywords

EID: 0001363451     PISSN: 12900729     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1290-0729(01)01281-9     Document Type: Article

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