Analysis of thermal properties by scanning thermal microscopy in nanocrystallized iron surface by ultrasonic shot peening

Materials Science and Engineering: A

Volumn 369, Issue 1-2, 2004, Pages 36-42

  Guo, F A ^a   Trannoy, N ^a   Lu, J ^b  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Nanocrystalline materials; Scanning thermal microscopy; Thermal conductivity; Ultrafine grained surface layer

Indexed keywords

ELECTRON SCATTERING; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; PHONONS; SHOT PEENING; THERMAL CONDUCTIVITY;

PHONON SCATTERING; SCANNING THERMAL MICROSCOPY (STHM);

IRON;

PEENING;

EID: 1542714897     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2003.11.029     Document Type: Article

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