A.C. Scanning thermal microscopy: Tip-sample interaction and buried defects modellings

International Journal of Thermal Sciences

Volumn 39, Issue 4, 2000, Pages 526-531

  Gomés, Séverine ^a   Trannoy, Nathalie ^a   Depasse, Françoise ^a   Grossel, Philippe ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

Modelling; Resolution; Thermal interaction; Thermal microscopy; Thermal probe; Thermal resistance

Indexed keywords

EID: 0034165363     PISSN: 12900729     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1290-0729(00)00232-5     Document Type: Article

References (14)

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