Thermal conductivity calibration for hot wire based dc scanning thermal microscopy

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2418-2423

  Lefèvre, Stéphane ^a   Volz, Sebastian ^a   Saulnier, Jean Bernard ^a   Fuentes, Catherine ^a   Trannoy, Nathalie ^b  

^a CNRS   (France)

^b Facult des Sciences   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANEMOMETERS; ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HEAT FLUX; HEAT TRANSFER; SCANNING; THERMAL CONDUCTIVITY;

SCANNING THERMAL MICROSCOPY;

ELECTRIC WIRE;

EID: 0038341806     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544078     Document Type: Article

References (4)

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3. A. Majumdar, Annu. Rev. Mater. Sci. 29, 505 (1999).
4. S. Gomes, N. Trannoy, and P. Grossel, Meas. Sci. Technol. 10, 805 (1999).