Photothermal FT-IR spectroscopy: a step towards FT-IR microscopy at a resolution better than the diffraction limit

Applied Spectroscopy

Volumn 53, Issue 7, 1999, Pages 810-815

  Hammiche, A ^a   Pollock, H M ^a   Reading, M ^b   Claybourn, M ^c   Turner, P H ^d   Jewkes, K ^d  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^c Bruker UK Ltd ^*  (United Kingdom)

^d Bruker Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED RADIATION; LIGHT; LIGHT ABSORPTION; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; POLYMERS; SPECTRUM ANALYSIS; SURFACES; TEMPERATURE; THERMOANALYSIS; THERMOMETERS;

DIFFRACTION LIMIT; FOURIER TRANSFORM INFRARED MICROSCOPY; INTERFEROGRAM; PHOTOTHERMAL; SPATIAL RESOLUTION; TEMPERATURE FLUCTUATIONS; WOLLASTON WIRE RESISTIVE THERMOMETER;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0032631324     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991947379     Document Type: Article

References (17)

1. M. Reading, D. J. Hourston, M. Song, H. M. Pollock, and A. Hammiche, Am. Lab. 30, 13 (1998).
2. A. Hammiche, M. Reading, H. M. Pollock, M. Song, and D. J. Hourston, Rev. Sci. Instrum. 67, 4268 (1996).
3. A. Hammiche, H. M. Pollock, M. Song, and D. J. Hourston, Meas. Sci. Technol. 7, 142 (1996).
4. A. Hammiche, H. M. Pollock, M. Song, D. J. Hourston, and M. Reading, J. Vac. Sci. Technol. B14, 1486 (1996).
5. H. M. Pollock, A. Hammiche, M. Song, D. J. Hourston, and M. Reading, J. Adhesion 67, 217 (1998).
6. D. M. Price, M. Reading, A. Caswell, A. Hammiche, and H. M. Pollock, Microsc. Anal. 65, 17 (1998).
7. D. M. Price, M. Reading, A. Hammiche, H. M. Pollock, and M. G. Branch, paper submitted to Thermochim. Acta.
8. J. M. R. Weaver, L. M. Walpita, and H. K. Wickramasinghe, Nature 342, 783 (1989).
9. C. C. Williams and H. K. Wickramasinghe, Soc. Photograph. Instrum. Eng. 897, 129 (1988).
10. S. Grafström, J. Kowalski, R. Neumann, O. Probst, and M. Wörtge, J. Vac. Sci. Technol. B9-2, 568 (1991).
11. N. Trannoy, P. Grossel, and M. Troyon, Probe Microsc. 1, 201 (1998).
12. E. Österschulze, M. Stopka, and R. Kassing. Microelectron. Eng. 24, 107 (1994).
13. D. A. Smith, S. Webster, M. Ayad, S. D. Evans, D. Fogherty, and D. N. Batchelder, Ultramicroscopy 61, 247 (1995); S. Webster, D. N. Batchelder, and D. A. Smith, Appl. Phys. Lett. 72, 1478 (1998).
14. D. A. Smith, S. Webster, M. Ayad, S. D. Evans, D. Fogherty, and D. N. Batchelder, Ultramicroscopy 61, 247 (1995); S. Webster, D. N. Batchelder, and D. A. Smith, Appl. Phys. Lett. 72, 1478 (1998).
15. H. S. Carslaw and J. C. Jaeger, Conduction of Heat in Solids (Clarendon Press, Oxford, 1947).
16. H. Zhou, A. Midha, G. Mills, S. Thorns, S. K. Murad, and J. M. R. Weaver, J. Vac. Sci. Technol. B16, 54 (1998).
17. D. P. Almond and P. M. Patel, Photothermal Science and Techniques (Chapman and Hall, London, 1996).