Review of low-frequency noise behaviour of polysilicon emitter bipolar junction transistors

IEE Proceedings: Circuits, Devices and Systems

Volumn 151, Issue 2, 2004, Pages 125-137

  Deen, M J ^a,b   Pascal, F ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; MOSFET DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR JUNCTIONS; SPURIOUS SIGNAL NOISE;

ANALOGUE INTEGRATED CIRCUITS; LOW FREQUENCY NOISE BEHAVIOR; POLYSILICON EMITTER BIPOLAR JUNCTION TRANSISTORS;

BIPOLAR TRANSISTORS;

EID: 2942631089     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20040106     Document Type: Article

References (49)

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