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Volumn PV 2005-01, Issue , 2005, Pages 437-455

Electrical characterization of high K devices: Charges and traps effects on instability, reliability and mobility behaviour

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; HAFNIUM COMPOUNDS; HYSTERESIS; OPTIMIZATION;

EID: 31844456313     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.