Statistical experimental design for quantitative atomic resolution transmission electron microscopy

Advances in Imaging and Electron Physics

Volumn 130, Issue SUPPL., 2004, Pages 1-164

  Van Aert, S ^a   Den Dekker, A J ^b   Van Den Bos, A ^c   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CONSTRAINT THEORY; MATHEMATICAL MODELS; NANOTECHNOLOGY; NEUTRON DIFFRACTION; OPTIMIZATION; STATISTICAL METHODS; X RAY DIFFRACTION;

EXIT WAVES; MATERIALS DESIGN; NANOMATERIALS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 3042600027     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(04)30001-7     Document Type: Article

References (134)

1. Barth J.E., Kruit P. Addition of different contributions to the charged particle probe size. Optik. 101:1996;101-109.
2. Batson P.E. Advanced spatially resolved EELS in the STEM. Ultramicroscopy. 78:1999;33-42.
3. Batson P.E., Dellby N., Krivanek O.L. Sub-ångstrom resolution using aberration corrected electron optics. Nature. 418:2002;617-620.
4. Bettens E., van Dyck D., den Dekker A.J., Sijbers J., van den Bos A. Model-based two-object resolution from observations having counting statistics. Ultramicroscopy. 77:1999;37-48.
5. Bevington P.R. Data Reduction and Error Analysis for the Physical Sciences. 1969;McGraw-Hill, New York.
6. Born M., Wolf E. Principles of Optics - Electromagnetic Theory of Propagation, Interference and Diffraction of Light. 1999;Cambridge University Press, Cambridge. 7th (expanded) ed.
7. Broeckx J., Op de Beeck M., van Dyck D. A useful approximation of the exit wave function in coherent STEM. Ultramicroscopy. 60:1995;71-80.
8. Browning N.D., Arslan I., Moeck P., Topuria T. Atomic resolution scanning transmission electron microscopy. Physica Status Solidi B. 227:2001;229-245.
9. Buseck P.R., Cowley J.M., Eyring L. High-Resolution Transmission Electron Microscopy and Associated Techniques. 1988;Oxford University Press, Oxford.
10. Cahn R.W. The Coming of Materials Science. 2001;187-210 Pergamon, New York. chapter 5.
11. Coene W., van Dyck D. New aspects in nonlinear image processing for high resolution electron microscopy. Scanning Microscopy. 2:1988;117-129. Supplement.
12. Coene W.M.J., Thust A., Op de Beeck M., van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy. 64:1996;109-135.
13. Conover W.J. Practical Nonparametric Statistics. 2nd ed. 1980;Wiley, New York.
14. Cowley J.M. Scanning transmission electron microscopy of thin specimens. Ultramicroscopy. 2:1976;3-16.
15. Cowley J.M. Scanning transmission electron microscopy. Amelinckx S., van Dyck D., van Landuyt J., van Tendeloo G. Handbook of Microscopy - Applications in Materials Science, Solid-State Physics and Chemistry, Methods II. 1997;563-594 VCH, Weinheim.
16. Cowley J.M., Moodie A.F. The scattering of electrons by atoms and crystals. I. A new theoretical approach. Acta Crystallographica. 10:1957;609-619.
17. Cramér H. Mathematical Methods of Statistics. 19th ed. 1999;Princeton University Press, Princeton.
18. Crewe A.V. The scanning transmission electron microscope. Orloff J. Handbook of Charged Particle Optics. 1997;401-427 CRC Press, Boca Raton.
19. de Jong A.F., van Dyck D. Ultimate resolution and information in electron microscopy II. The information limit of transmission electron microscopes. Ultramicroscopy. 49:1993;66-80.
20. de Jonge N., Lamy Y., Schoots K., Oosterkamp T.H. High brightness electron beam from a multi-walled carbon nanotube. Nature. 420:2002;393-395.
21. den Dekker A.J., Sijbers J., van Dyck D. How to optimize the design of a quantitative HREM experiment so as to attain the highest precision. Journal of Microscopy. 194:1999;95-104.
22. den Dekker A.J., van Aert S. Quantitative high resolution electron microscopy and Fisher information. Cross R. Proceedings of the 15th International Congress on Electron Microscopy, Interdisciplinary and Technical Forum Abstracts 2002 in Durban, South Africa. Vol. 3:2002;185-186 Microscopy Society of Southern Africa, Onderstepoort.
23. den Dekker A.J., van Aert S., van Dyck D., van den Bos A. A quantitative evaluation of different STEM imaging modes. Tománek P., Kolařík R. Proceedings of the 12th European Congress on Electron Microscopy, Instrumentation and Methodology 2000 in Brno, Czech Republic. Vol. 3:2000;131-132 The Czechoslovak Society for Electron Microscopy, Brno.
24. den Dekker A.J., van Aert S., van Dyck D., van den Bos A., Geuens P. Does a monochromator improve the precision in quantitative HRTEM? Koerten H.K. Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the Joint Meeting of the BVM and the NVvM 2000 in Papendal, Arnhem, The Netherlands. 2000;138-140 Press Point, Rijnsburg.
25. den Dekker A.J., van Aert S., van Dyck D., van den Bos A., Geuens P. Does a monochromator improve the precision in quantitative HRTEM? Ultramicroscopy. 89:2001;275-290.
26. Fedorov V.V. Theory of Optimal Experiments. 1972;Academic Press, New York.
27. Fejes P.L. Approximations for the calculation of high-resolution electron-microscope images of thin films. Acta Crystallographica A. 33:1977;109-113.
28. Frank J. The envelope of electron microscopic transfer functions for partially coherent illumination. Optik. 38:1973;519-536.
29. Frank J. Electron Tomography - Three-Dimensional Imaging with the Transmission Electron Microscope. 1992;Plenum Press, New York.
30. Frieden B.R. Physics from Fisher Information - A Unification. 1998;Cambridge University Press, Cambridge.
31. Fujita H., Sumida N. Usefulness of electron microscopy. Fujita F.E. Physics of New Materials. 1994;226-263 Springer-Verlag, Berlin.
32. Gabor D. A new microscopic principle. Nature. 161:1948;777-778.
33. Geuens P., van Dyck D. The S-state model: A work horse for HRTEM. Ultramicroscopy. 93:2002;179-198.
34. Geuens P., Chen J.H., den Dekker A.J., van Dyck D. An analytic expression in closed form for the electron exit wave. Acta Crystallographica A. 1999;. Supplement 55, Abstract P11.OE.002.
35. Haider M., Uhlemann S., Schwan E., Rose H., Kabius B., Urban K. Electron microscopy image enhanced. Nature. 392:1998;768-769.
36. Hartel P., Rose H., Dinges C. Conditions and reasons for incoherent imaging in STEM. Ultramicroscopy. 63:1996;93-114.
37. Henderson R. The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules. Q. Rev. Biophys. 28:1995;171-193.
38. Herrmann K.-H. Image recording in microscopy. Amelinckx S., van Dyck D., van Landuyt J., van Tendeloo G. Handbook of Microscopy - Applications in Materials Science, Solid-State Physics and Chemistry, Methods II. 1997;885-921 VCH, Weinheim.
39. Hirsch P.B., Howie A., Nicholson R.B., Pashley D.W., Whelan M.J. Electron Microscopy of Thin Crystals. 1965;Butterworths, London.
40. Howie A. Diffraction channelling of fast electrons and positrons in crystals. Philosophical Magazine. 14:1966;223-237.
41. Howie A. The theory of high energy electron diffraction. Amelinckx S., Gevers R., Remaut G., van Landuyt J. Modern Diffraction and Imaging Techniques in Material Science. 1970;295-339 North-Holland Publishing Company, Amsterdam.
42. Release 2001 for the Powder Diffraction File. 2001;International Centre for Diffraction Data, Pennsylvania. (This is a software package.).
43. Ishizuka K. Contrast transfer of crystal images in TEM. Ultramicroscopy. 5:1980;55-65.
44. Kabius B., Haider M., Uhlemann S., Schwan E., Urban K., Rose H. First application of a spherical-aberration corrected transmission electron microscope in materials science. J. Elect. Micro. 51:2002;51-58. Supplement.
45. Kambe K., Lehmpfuhl G., Fujimoto F. Interpretation of electron channeling by the dynamical theory of electron diffraction. Zeitschrift für Naturforschung. 29a:1974;1034-1044.
46. Kilaas R., Gronsky R. Real space image simulation in high resolution electron microscopy. Ultramicroscopy. 11:1983;289-298.
47. Kirkland E.J. Improved high resolution image processing of bright field electron micrographs I. Theory. Ultramicroscopy. 15:1984;151-172.
48. Kirkland E.J. Advanced Computing in Electron Microscopy. 1998;Plenum Press, New York.
49. Kisielowski C., Hetherington C.J.D., Wang Y.C., Kilaas R., O'Keefe M.A., Thust A. Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution. Ultramicroscopy. 89:2001;243-263.
50. Kisielowski C., Principe E., Freitag B., Hubert D. Benefits of microscopy with super resolution. Physica B. 308-310:2001;1090-1096.
51. Krivanek O.L., Dellby N., Nellist P.D. Aberration correction in the STEM. Cross R. Proceedings of the 15th International Congress on Electron Microscopy, Interdisciplinary and Technical Forum Abstracts 2002 in Durban, South Africa. Vol. 3:2002;29-30 Microscopy Society of Southern Africa, Onderstepoort.
52. Kruit P., Jansen G.H. Space charge and statistical Coulomb effects. Orloff J. Handbook of Charged Particle Optics. 1997;275-318 CRC Press, Boca Raton.
53. Lentzen M., Jahnen B., Jia C.L., Thust A., Tillmann K., Urban K. High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy. 92:2002;233-242.
54. Lichte H. Electron image plane off-axis holography of atomic structures. Mulvey T., Sheppard C.J.R. Advances in Optical and Electron Microscopy. Vol. 12:1991;25-91 Academic Press, London.
55. Möbus G.R., Schweinfest T., Gemming T., Wagner T., Rühle M. Iterative structure retrieval techniques in HREM: a comparative study and a modular program package. J. Microscopy. 190:1997;109-130.
56. Mood A.M., Graybill F.A., Boes D.C. Introduction to the Theory of Statistics. 3rd ed. 1974;McGraw-Hill, Singapore.
57. Mook H.W., Kruit P. Optics and design of the fringe field monochromator for a Schottky field emission gun. Nuclear Instruments and Methods in Physics Research A. 427:1999;109-120.
58. Mory C., Tence M., Colliex C. Theoretical study of the characteristics of the probe for a STEM with a field emission gun. J. Micro. Spect. Electro. 10:1985;381-387.
59. Muller D.A. Core level shifts and grain boundary cohesion. Bailey G.W., Alexander K.B., Jerome W.G., Bond M.G., McCarthy J.J. Microscopy and Microanalysis, Proceedings Microscopy and Microanalysis 1998 in Atlanta, Georgia. Vol. 4:1998;766-767 Springer, New York. Supplement 2.
60. Muller D.A. Why changes in bond lengths and cohesion lead to core-level shifts in metals, and consequences for the spatial difference method. Ultramicroscopy. 78:1999;163-174.
61. Muller D.A., Mills M.J. Electron microscopy: probing the atomic structure and chemistry of grain boundaries, interfaces and defects. Mat. Sci. Engin. A. 260:1999;12-28.
62. Murray W. Numerical Methods for Unconstrained Optimization. 1972;Academic Press, London.
63. Nalwa H.S. Nanostructured Materials and Nanotechnology: Concise Edition. 2002;Academic Press, San Diego.
64. Nellist P.D., Pennycook S.J. Subangstrom resolution by underfocused incoherent transmission electron microscopy. Phys. Rev. Lett. 81:1998;4156-4159.
65. Nellist P.D., Pennycook S.J. The principles and interpretation of annular dark-field Z-contrast imaging. Hawkes P.W. Advances in Imaging and Electron Physics. Vol. 113:2000;147-199 Academic Press, San Diego.
66. O'Keefe M.A. 'Resolution' in high-resolution electron microscopy. Ultramicroscopy. 47:1992;282-297.
67. O'Keefe M.A., Hetherington C.J.D., Wang Y.C., Nelson E.C., Turner J.H., Kisielowski C., Malm J.-O., Mueller R., Ringnalda J., Pan M., Thust A. Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV. Ultramicroscopy. 89:2001;215-241.
68. Olson G.B. Computational design of hierarchically structured materials. Science. 277:1997;1237-1242.
69. Olson G.B. Designing a new material world. Science. 288:2000;993-998.
70. Op de Beeck M., van Dyck D. Direct structure reconstruction in HRTEM. Ultramicroscopy. 64:1996;153-165.
71. Papoulis A. Probability, Random Variables, and Stochastic Processes. 1965;McGraw-Hill, New York.
72. Papoulis A. Systems and Transforms with Applications in Optics. 1968;McGraw-Hill, New York.
73. Pázman A. Foundations of Optimum Experimental Design. 1986;D. Reidel Publishing Company, Dordrecht.
74. Pennycook S.J. Scanning transmission electron microscopy: Z contrast. Amelinckx S., van Dyck D., van Landuyt J., van Tendeloo G. Handbook of Microscopy - Applications in Materials Science, Solid-State Physics and Chemistry, Methods II. 1997;595-620 VCH, Weinheim.
75. Pennycook S.J., Rafferty B., Nellist P.D. Z-contrast imaging in an aberration-corrected scanning transmission electron microscope. Microscopy and Microanalysis. 6:2000;343-352.
76. Pennycook S.J., Jesson D.E. High-resolution Z-contrast imaging of crystals. Ultramicroscopy. 37:1991;14-38.
77. Pennycook S.J., Jesson D.E. Atomic resolution Z-contrast imaging of interfaces. Acta Metallurgica et Materialia. 40:1992;149-159. Supplement.
78. Pennycook S.J., Jesson D.E., Chisholm M.F., Browning N.D., McGibbon A.J., McGibbon M.M. Z-contrast imaging in the scanning transmission electron microscope. J. Micro. Soc. Am. 1:1995;231-251.
79. Pennycook S.J., Yan Y. Z-contrast imaging in the scanning transmission electron microscope. Zhang X.-F., Zhang Z. Progress in Transmission Electron Microscopy 1 - Concepts and Techniques. 2001;81-111 Springer-Verlag, Berlin.
80. Phillipp F., Höschen R., Osaki M., Möbus G., Rühle M. New high-voltage atomic resolution microscope approaching 1 Å point resolution installed in Stuttgart. Ultramicroscopy. 56:1994;1-10.
81. Rayleigh Lord. Wave theory of light. Scientific Papers by John William Strutt, Baron Rayleigh. Vol. 3:1902;47-189 Cambridge University Press, Cambridge.
82. Reed M.A., Tour J.M. Computing with molecules. Sci. Am. 282:2000;68-75.
83. Reimer L. Particle optics of electrons. Transmission Electron Microscopy - Physics of Image Formation and Microanalysis. 1984;19-49 Springer-Verlag, Berlin.
84. Reimer L. Elements of a transmission electron microscope. Transmission Electron Microscopy - Physics of Image Formation and Microanalysis. 1993;86-135 Springer-Verlag, Berlin.
85. Rose H. Zur Theorie der Bildenstehung im Elektronen-Mikroskop I. Optik. 42:1975;217-244.
86. Rose H. Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope. Optik. 85:1990;19-24.
87. Sato M. Resolution. Orloff J. Handbook of Charged Particle Optics. 1997;319-361 CRC Press, Boca Raton.
88. Sato M., Orloff J. A new concept of theoretical resolution of an optical system, comparison with experiment and optimum condition for a point source. Ultramicroscopy. 41:1992;181-192.
89. Saxton W.O. Computer Techniques for Image Processing in Electron Microscopy. 1978;236-248 Academic Press, New York. chapter 9.
90. Saxton W.O. Quantitative comparison of images and transforms. J. Microscopy. 190:1997;52-60.
91. Scherzer O. The theoretical resolution limit of the electron microscope. Journal of Applied Physics. 20:1949;20-28.
92. Schiske P. Image processing using additional statistical information about the object. Hawkes P.W. Image Processing and Computer-aided Design in Electron Optics. 1973;82-90 Academic Press, London.
93. Sinkler W., Marks L.D. A simple channelling model for HREM contrast transfer under dynamical conditions. J. Microscopy. 194:1999;112-123.
94. Spence J.C.H. Experimental High-Resolution Electron Microscopy. 2nd ed. 1988;Oxford University Press, New York.
95. Spence J.C.H. The future of atomic resolution electron microscopy for materials science. Mat. Sci. Engi. R. 26:1999;1-49.
96. Springborg M. Methods of Electronic-Structure Calculations: From Molecules to Solids. 2000;Wiley, Chichester.
97. Stadelmann P.A. EMS - A software package for electron diffraction analysis and HREM image simulation in materials science. Ultramicroscopy. 21:1987;131-146.
98. Thust A., Jia C.L. Advances in atomic structure determination using the focal-series reconstruction technique. Tománek P., Kolařík R. Proceedings of the 12th European Congress on Electron Microscopy, Instrumentation and Methodology 2000 in Brno, Czech Republic. Vol. 3:2000;107-110 The Czechoslovak Society for Electron Microscopy, Brno.
99. Thust A., Overwijk M.H.F., Coene W.M.J., Lentzen M. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy. 64:1996;249-264.
100. Thust A., Coene W.M.J., Op de Beeck M., van Dyck D. Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy. 64:1996;211-230.
101. Treacy M.M.J. Optimising atomic number contrast in annular dark field images of thin films in the scanning transmission electron microscope. J. Micro. Spect. Electron. 7:1982;511-523.
102. van Aert S., den Dekker A.J., van den Bos A., van Dyck D. High-resolution electron microscopy: from imaging toward measuring. IEEE Trans. Instrument. Measure. 51:2002a;611-615.
103. van Aert S., den Dekker A.J., van den Bos A., van Dyck D. The benefits of statistical experimental design for quantitative electron microscopy. Cross R. Proceedings of the 15th International Congress on Electron Microscopy, Interdisciplinary and Technical Forum Abstracts 2002 in Durban, South Africa. Vol. 3:2002b;189-190 Microscopy Society of Southern Africa, Onderstepoort.
104. van Aert S., den Dekker A.J., van Dyck D., van den Bos A. Design aspects for an optimum DF STEM probe. Tománek P., Kolařík R. Proceedings of the 12th European Congress on Electron Microscopy, Instrumentation and Methodology 2000 in Brno, Czech Republic. Vol. 3:2000;129-130 The Czechoslovak Society for Electron Microscopy, Brno.
105. van Aert S., den Dekker A.J., van Dyck D., van den Bos A. High-resolution electron microscopy and electron tomography: Resolution versus precision. J. Struct. Biol. 138:2002a;21-33.
106. van Aert S., den Dekker A.J., van Dyck D., van den Bos A. Optimal experimental design of STEM measurement of atom column positions. Ultramicroscopy. 90:2002b;273-289.
107. van Aert S., van Dyck D. Do smaller probes in a scanning tranmission electron microscope result in more precise measurement of the distances between atom columns? Philosophical Magazine B. 81:2001;1833-1846.
108. van Aert S., van Dyck D., den Dekker A.J., van den Bos A. Quantitative ADF STEM: guidelines towards an improved experimental design. Koerten H.K. Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the Joint Meeting of the BVM and the NVuM 2000 in Papendal, Arnhem, The Netherlands. 2000;126-127 Press Point, Rijnsburg.
109. van den Bos A. Parameter estimation. Sydenham P.H. Handbook of Measurement Science. Vol. 1:1982;331-377 Wiley, Chicester.
110. van den Bos A. Measurement errors. Webster J.G. Encyclopedia of Electrical and Electronics Engineering. Vol. 12:1999;448-459 Wiley, New York.
111. van den Bos A. Afscheidsrede - Naar Waarde Schatten; Valedictory Address. 2002;. Technische Universiteit Delft.
112. van den Bos A., den Dekker A.J. Resolution reconsidered - Conventional approaches and an alternative. Hawkes P.W. Advances in Imaging and Electron Physics. Vol. 117:2001;241-360 Academic Press, San Diego.
113. van Dyck D. High-resolution electron microscopy. Hawkes P.W. Advances in Imaging and Electron Physics. Vol. 123:2002;105-171 Academic Press, San Diego.
114. van Dyck D., de Jong A.F. Ultimate resolution and information in electron microscopy: general principles. Ultramicroscopy. 47:1992;266-281.
115. van Dyck D., Danckaert J., Coene W., Selderslaghs E., Broddin D., van Landuyt J., Amelinckx S. The atom column approximation in dynamical electron diffraction calculations. Krakow W., O'Keefe M. Computer Simulation of Electron Microscope Diffraction and Images. 1989;107-134 The Minerals, Metals & Materials Society, Warrendale.
116. van Dyck D., Chen J.H. A simple theory for dynamical electron diffraction in crystals. Solid State Communications. 109:1999a;501-505.
117. van Dyck D., Chen J.H. Towards an exit wave in closed analytical form. Acta Crystallographica A. 55:1999b;212-215.
118. van Dyck D., Op de Beeck M. A simple intuitive theory for electron diffraction. Ultramicroscopy. 64:1996;99-107.
119. van Dyck D., Op de Beeck M., Coene W. "A new approach to object wavefunction reconstruction in electron microscopy." Optik. 93:1993;103-107.
120. van Dyck D., van Aert S., den Dekker A.J., van den Bos A. How to select the items for the shopping list of future high resolution electron microscopists? Voelkl E., Piston D., Gauvin R., Lockley A.J., Bailey G.W., McKernan S. Microscopy and Microanalysis, Proceedings Microscopy and Microanalysis 2002 in Qubec City, Canada. Vol. 8:2002;94-95 Cambridge University Press, Cambridge. Supplement 2.
121. van Dyck D., van Aert S., den Dekker A.J., van den Bos A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Ultramicroscopy. 98:2003;27-42.
122. van Dyck D., Coene W. A new procedure for wave function restoration in high resolution electron microscopy. Optik. 77:1987;125-128.
123. van Tendeloo G., Pauwels B., Geuens P., Lebedev O. TEM of nanostructured materials. Gemperlová J., Vávra I. Proceedings of the 12th European Congress on Electron Microscopy, Physical Sciences 2000 in Brno, Czech Republic. Vol. 2:2000;1-6 The Czechoslovak Society for Electron Microscopy, Brno.
124. 4Mn. Physica Status Solidi A. 49:1978;337-346.
125. 23 phase. Physica Status Solidi A. 69:1982;103-120.
126. van Veen A.H.V., Hagen C.W., Barth J.E., Kruit P. "Reduced brightness of the ZrO/W Schottky electron emitter." J. Vac. Sci. Technol. B. 19:2001;2038-2044.
127. Wada Y. Atom electronics: a proposal of nano-scale devices based on atom/molecule switching. Microelect. Engin. 30:1996;375-382.
128. Wang Z.L. Inelastic scattering in electron microscopy - Effects, spectrometry and imaging. Zhang X.-F., Zhang Z. Progress in Transmission Electron Microscopy 1 - Concepts and Techniques. 2001;113-159 Springer-Verlag, Berlin.
129. Weißbäcker C., Rose H. Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part I). J. Elect. Microscopy. 50:2001;383-390.
130. Weißbäcker C., Rose H. Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part II). J. Elect. Microscopy. 51:2002;45-51.
131. Wiesendanger R. Scanning Probe Microscopy and Spectroscopy - Methods and Applications. 1994;Cambridge University Press, Cambridge.
132. Williams D.B., Carter C.B. Transmission Electron Microscopy - A Textbook for Materials Science. 1996;Plenum Press, New York.
133. Zanchet D., Hall B.D., Ugarte D. X-ray characterization of nanoparticles. Wang Z.L. Characterization of Nanophase Materials. 2000;13-36 Wiley-VCH, Weinheim.
134. Zandbergen H.W., van Dyck D. Exit wave reconstructions using through focus series of HREM images. Microscopy Research and Technique. 49:2000;301-323.