-
3
-
-
77957728405
-
Resolving or separating power of optical instruments
-
Cambridge University Press
-
Baron Rayleigh. Resolving or separating power of optical instruments. Scientific papers of John William Strutt Vol. 1 (1899), Cambridge University Press 415-423
-
(1899)
Scientific papers of John William Strutt
, vol.1
, pp. 415-423
-
-
Baron Rayleigh1
-
5
-
-
0032951418
-
-
Bettens E., Van Dyck D., den Dekker A.J., Sijbers J., and Van den Bos A. Ultramicroscopy 77 (1999) 37-48
-
(1999)
Ultramicroscopy
, vol.77
, pp. 37-48
-
-
Bettens, E.1
Van Dyck, D.2
den Dekker, A.J.3
Sijbers, J.4
Van den Bos, A.5
-
9
-
-
0009779033
-
-
Krakow W., and O'Keefe M. (Eds), The Minerals, Metals and Materials Society, Warrendale: PA
-
Castano V. In: Krakow W., and O'Keefe M. (Eds). Computer Simulation of Electron Microscope Diffraction and Images (1989), The Minerals, Metals and Materials Society, Warrendale: PA 33
-
(1989)
Computer Simulation of Electron Microscope Diffraction and Images
, pp. 33
-
-
Castano, V.1
-
16
-
-
0015672282
-
-
Frank J. Optik 38 (1973) 519
-
(1973)
Optik
, vol.38
, pp. 519
-
-
Frank, J.1
-
18
-
-
77957726440
-
-
Brno, Czech Republic, July 9-14, 2000
-
Guens P., Lebedev O.I., Van Dyck D., and Van Tendeloo G. Proceedings of the Twelfth International Congress on Electron Microscopy. Brno, Czech Republic, July 9-14, 2000 (2000)
-
(2000)
Proceedings of the Twelfth International Congress on Electron Microscopy
-
-
Guens, P.1
Lebedev, O.I.2
Van Dyck, D.3
Van Tendeloo, G.4
-
21
-
-
33645001913
-
-
Jensen J., Fan H., Xiang S., Li F., Pan Q., Uyeda N., and Fujiyoshi Y. Ultramicroscopy 36 (1991) 361-365
-
(1991)
Ultramicroscopy
, vol.36
, pp. 361-365
-
-
Jensen, J.1
Fan, H.2
Xiang, S.3
Li, F.4
Pan, Q.5
Uyeda, N.6
Fujiyoshi, Y.7
-
24
-
-
0035182846
-
-
Kisielowski C., Hetherington J.D., Wang Y.C., Kilaas R., O'Keefe M.A., and Thust A. Ultramicroscopy 89 (2001) 243-263
-
(2001)
Ultramicroscopy
, vol.89
, pp. 243-263
-
-
Kisielowski, C.1
Hetherington, J.D.2
Wang, Y.C.3
Kilaas, R.4
O'Keefe, M.A.5
Thust, A.6
-
27
-
-
0003641364
-
-
Tonomura A., Allard L.F., Pozzi G., Joy D.C., and Ono Y.A. (Eds), North Holland/Elsevier, Amsterdam
-
Op de Beeck M., Van Dyck D., and Coene W. In: Tonomura A., Allard L.F., Pozzi G., Joy D.C., and Ono Y.A. (Eds). Electron Holography (1995), North Holland/Elsevier, Amsterdam 307-316
-
(1995)
Electron Holography
, pp. 307-316
-
-
Op de Beeck, M.1
Van Dyck, D.2
Coene, W.3
-
28
-
-
77957738844
-
-
to be published
-
Plitzko, J.M., Campbell, G. H., Foiles, S. M., Kim, W. E., and Kisielowski, C., to be published.
-
-
-
Plitzko, J.M.1
Campbell, G.H.2
Foiles, S.M.3
Kim, W.E.4
Kisielowski, C.5
-
36
-
-
0030221538
-
-
Tang D., Zandbergen H., Jansen J., Op de Beeck M., and Van Dyck D. Ultramicroscopy 64 (1996) 265-276
-
(1996)
Ultramicroscopy
, vol.64
, pp. 265-276
-
-
Tang, D.1
Zandbergen, H.2
Jansen, J.3
Op de Beeck, M.4
Van Dyck, D.5
-
38
-
-
77957724486
-
-
Brno, Czech Republic, July 9-14, 2000
-
Van Aert S., den Dekker A.J., Van Dyck D., and Van den Bos A. Proceedings of the Twelfth International Congress on Electron Microscopy. Brno, Czech Republic, July 9-14, 2000 (2000)
-
(2000)
Proceedings of the Twelfth International Congress on Electron Microscopy
-
-
Van Aert, S.1
den Dekker, A.J.2
Van Dyck, D.3
Van den Bos, A.4
-
43
-
-
0002827996
-
-
Krakow W., and O'Keefe M. (Eds), TMS Publications, The Minerals, Metals and Materials Society, Warrendale, PA
-
Van Dyck D., Danckaert J., Coene W., Selderslaghs E., Broddin D., Van Landuyt J., and Amelinckx S. In: Krakow W., and O'Keefe M. (Eds). Computer Simulation of Electron Microscope Diffraction and Images (1989), TMS Publications, The Minerals, Metals and Materials Society, Warrendale, PA 107-134
-
(1989)
Computer Simulation of Electron Microscope Diffraction and Images
, pp. 107-134
-
-
Van Dyck, D.1
Danckaert, J.2
Coene, W.3
Selderslaghs, E.4
Broddin, D.5
Van Landuyt, J.6
Amelinckx, S.7
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