Optics and design of the fringe field monochromator for a Schottky field emission gun

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 427, Issue 1-2, 1999, Pages 109-120

  Mook, H W ^a   Kruit, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRODES; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON GUNS; OPTICS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY FILTER; SCHOTTKY FIELD EMISSION GUN; WIEN FILTER;

MONOCHROMATORS;

EID: 0345148367     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01511-3     Document Type: Article

References (18)

1. Batson P.E. J. Microscopy. 180:1995;204.
2. Kurata H.et al. J. Electron Microsc. 45:1996;79.
3. Terauchi M.et al. Microsc. Microanal. Microstruct. 2:1991;351.
4. M. Essig, J. Geiger, Proceedings of the European Conference on Electron Microscopy, vol. 3, 1980.
5. Rose H. Optik. 3:1990;95.
6. Kruit P.et al. Nucl. Instr. and Meth. A. 363:1995;220.
7. H.W. Mook, P. Kruit, On the monochromatisation of high brightness electron sources for electron microscopy, Ultramicroscopy, submitted.
8. Mook H.W., Kruit P. Inst. Phys. Conf. Ser. 153(2):1997;81.
9. H.W. Mook, Thesis (1999) Delft University of Technology, The Netherlands, 1999, to be published.
10. Kato M., Tsuno K. Nucl. Instr. and Meth. A. 298:1990;296.
11. Tsuno K., Rouse J. J. Electron Microsc. 45:1996;417.
12. Kramer J. Brit. J. Appl. Phys. 18:1967;1815.
13. Lenc M., Lencova B. Optik. 78:1988;127-131.
14. Hawkes P.W., Kasper E. Principles of Electron Optics. 1:1989;470.
15. Kruit P., Jansen G.H. Orloff J. Handbook of Charged Particle Optics. 1997;275 CRC Press, Boca Raton, FL.
16. Fransen M.J., van Raay T.L., Kruit P. J. Vac. Sci. Technol. B. 16:1998;2063-2072.
17. S. Beck, K.H. Herrmann, Poster at European Conference on Electron Microscopy, 1992.
18. Barth J., Kruit P. Optik. 101(3):1996;101.