Scanning Transmission Electron Microscopy

Handbook of Microscopy: Applications in Materials Science , Solid-state Physics and Chemistry

Volumn , Issue , 2008, Pages 563-594

  Cowley, John ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

SCANNING TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84960202697     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527620524.ch2     Document Type: Chapter

References (97)

1. A. V. Crewe, J. Wall, J. Mol. Biol. 1970,48, 373.
2. A. V. Crewe, Rep. Progr. Phys. 1980, 43, 621.
3. A. V. Crewe, J. Wall, J. Langmore, Science 1970,168, 1333.
4. J. M. Cowley, Appl. Phys. Letts. 1969, 75, 58.
5. E. Zeitler, M. G. R. Thompson, Optik 1970, 31, 258, 359.
6. J. R. Sellar, J. M. Cowley in Scanning Electron Microscopy 1973 (Ed.: O. Johari), HT Research Institute, Chicago 1973, p. 243.
7. T. Groves, Ultramicroscopy 1975, 1, 15.
8. A Strojnik in Microscopie Electronique à Haute Tension (Eds: B. Jouffrey, P. Favard), Société Française de Micros. Electronique, Paris 1976.
9. J. M. Cowley, Ultramicroscopy 1976, 2, 3.
10. A. Howie, J. Microsc. 1979, 17, 11.
11. M. M. J. Treacy, A. Howie, J. Catal. 1980, 63, 265.
12. Z. L. Wang, J. M. Cowley, Ultramicroscopy 1990, 32, 275.
13. P. Zu, R. F. Loane, J. Silcox, Ultramicroscopy 1991, 38, 127.
14. S. J. Pennycook, D. E. Jesson, Ultramicroscopy 1991, 37, 14.
15. S. Hillyard, J. Silcox, Ultramicroscopy 1993, 52, 325.
16. N. H. Dekkers, H. de Lang, Optik 1974, 41, 452.
17. J. M. Chapman, P. E. Batson, E. M. Waddell, R. P. Ferrier, Ultramicroscopy 1978, 3, 203.
18. I. R. McFayden, J. M. Chapman, Electron Microsc. Soc. Amer. Bull. 1992, 22, 64.
19. M. Hammel, H. Kohi, H. Rose in Proc. Xllth Internat. Congress Electron Microsc. (Eds.: L. D. Peachey, D. B. Williams) San Francisco Press, San Francisco 1990, Vol. 1, p. 120.
20. Cowley J.M.
21. J. M. Cowley, Ultramicroscopy.
22. J. M. Cowley, A. Y. Au in Scanning Electron Microscopy, Vol. 1 (Ed.: O. Johari), SEM Inc., Chicago 1978, p. 53.
23. J. Liu, J. M. Cowley, Ultramicroscopy 1993, 52, 335.
24. H. Rose, Ultramicroscopy 1977, 2, 251.
25. W. Kunath, H. Gross, Ultramicroscopy 1985, 16, 349.
26. C. J. Humphreys, E. G. Bithell in Electron Diffraction Techniques, Vol. 1 (Ed.: J. M. Cowley), Oxford University Press 1992, p. 75.
27. J. Barry in Electron Diffraction Techniques, Vol. 1 (Ed.: J. M. Cowley), Oxford University Press 1992, p. 170.
28. J. M. Cowley, J. C. H. Spence, Ultramicroscopy 1981, 6, 359.
29. J. C. H. Spence, J. M. Cowley Optik 1978, 50, 129.
30. W. Hoppe, Ultramicroscopy 1982, 10, 187.
31. R. Nathan in Digital Processing in Biomedical Imaging (Eds.: K. Preston, M. Onoe), Plenum Press, New York 1976, p. 75.
32. P. E. Batson, Ultramicroscopy 1992, 47, 133.
33. F. P. Ottensmeyer, J. W. Andrew, J. Ultrastruct. Res. 1980, 72, 336.
34. D. B. Williams, J. R. Michael, J. I. Goldstein, A. D. Romig, Jr. Ultramicroscopy 1992, 47, 121.
35. M. Scheinfein, A. Muray, M. Isaacson, Ultramicroscopy 1985,16, 237.
36. H. Raether, Excitation of Plasmons and Interband Transitions by Electrons, Springer Tracts in Modern Physics, Vol. 88, Springer, New York 1980.
37. Z. L. Wang, J. M. Cowley, Ultramicroscopy 1987, 21, 11.
38. J. M. Cowley, Phys. Rev. B 1982, 25, 1401.
39. N. Zabala, P. M. Echenique, Ultramicroscopy 1990, 32, 327.
40. R. H. Milne, G. G. Hembree, J. S. Drucker, C. J. Harland, J. A. Venables, J. Microsc. 1993, 170, 193.
41. K. Kuroda, S. Hosoki, T. Komoda, Scanning Microscopy 1987, 7, 911.
42. J. Liu, J. M. Cowley, Scanning Microscopy 1988, 2, 1957.
43. M. R. Scheinfein, J. S. Drucker, J. K. Weiss, Phys. Rev. B 1993, 47, 4068.
44. G. G. Hembree, P. A. Crozier, J. S. Drucker, M. Krishnamurthy, J. A. Venables, J. M. Cowley, Ultramicroscopy 1989, 31, 111.
45. J. Liu, G. G. Hembree, G. E. Spinnler, J. A. Venables, Ultramicroscopy 1993, 52, 369.
46. J. M. Cowley, Ultramicroscopy 1979, 4, 435.
47. W. J. Vine, R. Vincent, P. Spellward, J. W. Steeds, Ultramicroscopy 1992, 41, 423.
48. J. M. Cowley in Scanning Electron Microscopy 1980, Vol. 1 (Ed.: Om Johari), SEM Inc., Chicago 1980, p. 61.
49. J. Zhu, J. M. Cowley, Acta Crystallogr. A 1982, 38, 718
50. J. Zhu, J. M. Cowley, J. Appl. Crystallogr. 1983, 16, 171
51. M. Pan, J. M. Cowley, J. C. Barry, Ultramicroscopy 1989, 30, 385.
52. J. M. Cowley, Sov. Phys. Crystallogr. 1981, 26, 549.
53. J. M. Cowley, Ultramicroscopy 1979, 4, 413.
54. V. Ronchi, Appl. Optics 1964, 3, 437.
55. J. A. Lin, J. M. Cowley, Ultramicroscopy 1986, 19, 31.
56. S.-Y. Wang, J. M. Cowley, Micros. Res. Techs. 1995,30, 181.
57. D. Gabor, Nature 1948, 161, 111.
58. D. Gabor, Proc. R. Soc. Lond. 1949, A197, 454.
59. J. A. Lin, J. M. Cowley, Ultramicroscopy 1986, 19, 179.
60. E. N. Leith, J. Upatnieks, J. Opt. Soc. Amer. 1962,52, 1123.
61. J. Konnert, P. D'Antonio, J. M. Cowley, A. Higgs, H. J. Ou, Ultramicroscopy 1989, 30, 371.
62. J. M. Rodenburg, R. H. T. Bates, Philos. Trans. R. Soc. Lond. 1992, A339, 521.
63. J. M. Rodenburg, B. C. McCallum, P. D. Nellist, Ultramicroscopy 1993, 48, 304.
64. J. M. Cowley, Ultramicroscopy 1992, 41, 335.
65. I. R. McFayden, J. N. Chapman, Electron Micros. Soc. Amer. Bull. 1992, 22, 64.
66. L. H. Veneklasen, Optik 1975, 44, 447.
67. M. A. Gribelyuk, J. M. Cowley, Ultramicroscopy 1992, 45, 115.
68. M. Mankos, M. R. Scheinfein, J. M. Cowley, J. Appl. Phys. 1994, 75, 7418.
69. M. Mankos, P. de Haan, V. Kambersky, G. Matteucci, M. R. McCartney, Z. Yank, M. Scheinfein, J. M. Cowley in Electron Holography (Eds.: A. Tonomura et al.), Elsevier Science BV 1995, p. 329.
70. Th. Leuthner, H. Lichte, K.-H. Herrmann, Phys. Stat. Solidi (a), 1989, 116, 113.
71. H. Lichte, Ultramicroscopy 1993, 51, 15.
72. J. M. Cowley, M. Disko, Ultramicroscopy 1980, 5, 469.
73. J. A. Venables, J. M. Cowley, H. S. von Harrah in Inst. Phys. Conf. Series, No. 90, Chapter 4, IOP Publishing, Bristol 1987, p. 81.
74. P. Kruit, J. A. Venables, Ultramicroscopy 1988, 25, 183.
75. J. Liu, J. M. Cowley, Ultramicroscopy 1993, 48, 381.
76. J. P. Langmore, J. Wall, M. S. Isaacson, Optik 1973, 38, 335.
77. M. Retsky, Optik 1974, 41, 127.
78. M. D. Cole, J. W. Wiggins, M. Beer, J. Mol. Biol. 1978,117, 378.
79. M. Isaacson, D. Kopf, M. Utlaut, N. W. Parker, A. V. Crewe, Proc. Nat. Acad. Sci. USA 1977, 74, 1802.
80. M. K. Lamvik, J. P. Langmore, Scanning Electron Microscopy 1977, Vol. 1 (Ed.: Om Johari), HT Research Institute, Chicago 1977, p. 401.
81. A. V. Crewe, J. Wall in Proc. 29th Annual Meeting, Electron Micros. Soc. Amer. (Ed.: C. J. Arceneaux), Claitors Publ. Divis., Baton Rouge 1971, p. 24.
82. G. J. Brakenhoff, N. Nanninga, J. Pieters, J. Ultrastructure Research 1972, 41, 238.
83. S. B. Rice, J. Y. Koo, M. M. Disko, M. M. J. Treacy, Ultramicroscopy 1990, 34, 108.
84. M. Pan, J. M. Cowley, I. Y. Chan, Ultramicroscopy 1990, 34, 93.
85. C. E. Lyman, Ultramicroscopy 1986, 20, 119.
86. E. Freund, J. Lynch, R. Szymansky, Ultramicroscopy 1986, 20, 107.
87. P. Rez in Physical Methods of Chemistry, Vol. 4, Microscopy (Eds.: B. W. Rossiter, J. F. Hamilton), John Wiley & Sons, New York 1991, p. 203.
88. J. A. Allpress, J. V. Sanders, Surf. Sci 1965, 7, 1.
89. W. B. Monosmith, J. M. Cowley, Ultramicroscopy 1984,12, 111.
90. J. M. Cowley, M. A. Osman, P. Humble, Ultramicroscopy 1984,15, 311.
91. P. Humble, Proc. R. Soc. Lond. 1982, A381, 65.
92. S. Iijima, Nature 1991, 354, 56.
93. M. Liu, J. M. Cowley, Ultramicroscopy 1994,53, 333.
94. H. J. Ou, J. M. Cowley, Phys. Status Solidi (a) 1988, 107, 719.
95. R. H. Milne in Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces (Eds.: P. K. Larsen, P. J. Dobson), Plenum Press, New York and London 1988, p. 317.
96. J. M. Cowley, Ultramicroscopy 1989, 27, 319.
97. J. Liu, J. M. Cowley, Ultramicroscopy 1991, 37, 50.