Image Recording in Microscopy

Handbook of Microscopy: Applications in Materials Science , Solid-state Physics and Chemistry

Volumn , Issue , 2008, Pages 885-921

  Herrmann, K H ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSED MATTER PHYSICS; MATERIALS SCIENCE;

IMAGE RECORDING;

EID: 84960306037     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527620524.ch16     Document Type: Chapter

References (107)

1. A. Rose, J. Soc. Mot. Picture Eng. 1946, 47, 273.
2. J. C. Dainty, R. Show, Image Science, Academic Press, London 1974.
3. C. Jones, J. Opt. Soc. Am. 1959, 49, 645.
4. L. Mandel, Br. J. Appl. Phys. 1959, 10, 233.
5. E. Breitenberger, Progr. Nucl. Phys. 1955,4, 56.
6. K.-H. Herrmann, D. Krahl, Adv. Opt. El. Micr. 1984,9, 1.
7. A. Boksenberg, C. I. Coleman, Adv. Electron. Electron Phys. 1979, 52, 355.
8. U. Fano, Phys. Rev. 1947, 72, 26.
9. H. J. Zweig, J. Opt. Soc. Am. 1961, 51, 310.
10. P. N. J. Dennis, Photodetectors: An Introduction to Current Technology, Plenum Press, New York 1985.
11. M. Jedlicka, P. Kulhânek, Vacuum 1986, 36, 515.
12. H. P. Kallmann, G. M. Spruch, Luminescence of Organic and Inorganic Materials, Wiley, New York 1962.
13. D. C. Joy, Inst. Phys. Conf. Ser., EUREM 88, York 1988, 93, 23.
14. I. Daberkow, K.-H. Herrmann, L. Libin, W.-D. Rau, Ultramicroscopy 1991, 38, 215.
15. M. Kotera, Y. Kamiya, Ultramicroscopy 1994, 54, 293.
16. D. E. Husk, S. E. Schnatterly, J. Opt. Soc. Am. B, 1992, 9, 660.
17. S. M. Grüner, J. R. Milch, G. T. Reynolds, Nucl. Instrum. Methods 1982, 195, 287.
18. JEDEC, Optical Characteristics of Cathode Ray Tube Screens, Electrical Industry Association, Washington DC. 1975.
19. J. H. Chappell, S. S. Murray, Nucl. Instrum. Methods 1984, 221, 159.
20. R. Autrata, P. Schauer, Jiri Kvapil, Josef Kvapil, Scanning 1983, 5, 91.
21. Galileo Electro-Optics Corp. Fibre Optics: Theory and Application, Technical Memorandum 100, Fibre Optic Faceplates, Data Sheet 1000. Gallileo Electro-Optics Corp., Sturbridge, MA.
22. Optische Werke G. Rodenstock, X-Ray Manual, Optische Werke G. Rodenstock, München 1992.
23. L. Reimer, Scanning Electron Microscopy, Springer Series in Optical Science, Vol. 45, Springer, Berlin 1985.
24. L. Reimer, Image Formation in Low-Voltage Scanning Microscopy, Tutorial Texts in Optical Engineering, No. 12, SPIE Optical Engineering Press, Bellingham 1993.
25. G. W. Goetze, Adv. Electron. Electron Phys. 1966, 22A, 219.
26. M. Sonoda, M. Takano, J. Miyahara, H. Kato, Radiology 1983, 148, 833.
27. Y. Amemiya, K. Wakabayashi, H. Tanaka, Y. Ueno, J. Miyahara, Science 1987, 237, 164.
28. N. Mori, T. Oikawa, T. Katoh, J. Miyahara, Y. Harada, Ultramicroscopy 1988, 25, 195.
29. D. Shindo, K. Hiraga, T. Oikawa, N. Mori, J. Electron Microsc. 1990, 39, 449.
30. S. Isoda, K. Saitoh, T. Ogawa, S. Moriguchi, T. Kobayashi, Ultramicroscopy 1992, 41, 99.
31. C. Burmester, H. G. Braun, R. R. Schröder, Ultramicroscopy 1994, 55, 55.
32. L. M. Biberman, S. Nudeiman (Eds.), Photoelectronic Imaging Devices, Vol. I and II, Plenum Press, New York 1971.
33. E. H. Eberhardt, Appl. Optics 1968, 7, 2037.
34. M. Lampton, Sci. Am. 1981, 245(5), 46.
35. K.-H. Herrmann, M. Korn, J. Phys. E: Sci. Instrum. 1987,20, 177.
36. Galileo Electro-Optics Corp. MicroChannel Plates, Data Sheet 9000, Detector Assemblies. Data Sheet 7000. Galileo Electro-Optics Corp., Sturbridge, MA.
37. R. G. Neuhauser, J. SMPTE 1987, 96, 473.
38. B. L. Morgan (Ed.), Adv. Electron. Electron Phys. 1988, 74.
39. G. A. Robinson, J. SMPTE 1980, 89, 249.
40. D. F. Barbe (Ed.), Charge Coupled Devices. Springer Topics in Applied Physics, Vol. 38, Springer, Berlin 1980.
41. Photometries Ltd., Charge-Coupled Devices for Quantitative Electronic Imaging, Photometries Ltd., Tucson 1989.
42. R. P. Khosla, Microelectr. Eng. 1992, 19, 615.
43. Philips, J. Res. [Special issue] 1994, 48, 3.
44. M. L. Blouke (Ed.), SPIE Proc. 1994, 2172.
45. E. R. Fossum, SPIE Proc. 1994, 2172, 38.
46. M. Rabbani, R. van Metter, J. Opt. Soc. Am. A 1989,15, 1156.
47. H. Mulder, J. Opt. Soc. Am. A 1993,10, 2038.
48. J. C. Feltz, M. A. Karim, Appl. Opt. 1990, 29, 111.
49. D. Shotton (Ed.), Techniques in Modern Biomedical Microscopy, Wiley-Liss, New York 1993.
50. S. Inoué (Ed.), Video Microscopy, Plenum Press, New York 1986.
51. T. T. Tsay, R. Inman, B. Wray, B. Herman, K. Jacobsen, J. Microsc. 1990, 160, 141.
52. H. Gursky, G. Fritz, Scanning 1991, 13, 41.
53. R. K. Aikens, D. A. Agard, J. W. Sedat, Methods Cell Biol. 1989, 29, 291.
54. B. R. Masters, G. S. Kino, Electronic Light Microscopy, Wiley-Liss, New York 1993, p. 315.
55. E. Zeitler, Ultramicroscopy 1992, 46, 405.
56. J. F. Hamilton, J. C. Marchant, J. Opt. Soc. Am. 1967, 57, 232.
57. M. Hahn, Electron Microscopy at Molecular Dimensions (Eds.: W. Baumeister, W. Vogell) Springer, Berlin 1980, p. 200.
58. D. G. Ast, J. Appl. Phys. 1974, 45, 4638.
59. D. A. Grano, K. H. Downing, 38th Annu. EMS A Meeting 1980, 228.
60. K.-H. Herrmann, Electron Microsc. 1982, 1, 131.
61. K.-H. Herrmann, D. Krahl, H.-P. Rust, O. Ulrichs, Ultramicroscopy 1978, 3, 227.
62. J. C. H. Spence, J. M. Zuo, Rev. Sci. Instrum. 1988, 59, 2102.
63. S. Kujawa, D. Krahl, Ultramicroscopy 1992, 46, 395.
64. O. L. Krivanek, P. E. Mooney, Ultramicroscopy 1993, 49, 95.
65. W. J. de Ruijter, Micron 1995, 26, 247.
66. K.-H. Herrmann, R. Sikeier, Optik 1995, 98, 119.
67. H. Niedrig, Electron Beam Interactions with Solids for Microscopy, Microanalysis & Microlithography (Eds. D. F. Kyser, H. Niedrig, D. E. Newbury, R. Shimizu), Scanning Electron Microscopy, Inc., AMF O'Hare 1982, p. 51..
68. U. Werner, H. Bethge, J. Heydenreich, Ultramicroscopy 1982, 8, 417.
69. I. Daberkow, K.-H. Herrmann, L. Liu, W. D. Rau, H. Tietz, Ultramicroscopy, submitted.
70. A. L. Weickenmeier, W. Nuchter, J. Mayer, Optik 1995, 99, 147.
71. J. M. Zuo, Electron Microsc. 1994, 1, 215.
72. G. Y. Fan, M. H. Ellisman, Ultramicroscopy 1993,52,21.
73. K.-H. Herrmann, L. Liu, Optik 1992, 92, 48.
74. D. G. Stearns, J. D. Wiedwald, Rev. Sci. Instrum. 1989, 60, 1095.
75. B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabokuro, B. K. Fujikawa, Atomic Data Nucl. Data Tables 1982, 27, 1.
76. K. Murata, M. Tanaka, K. Kawata, Optik 1990, 84, 163.
77. L. Jochum, SPIE Proc. 1986, 733, 492.
78. J. Miyahara, K. Takahashi, Y. Amemiya, N. Kaniya, Y. Satow, Nucl. Instrum. Methods A 1986, 246, 572.
79. T. Tomie, H. Shimizu, T. Majima, M. Yamoda, T. Kanayama, H. Kondo, M. Yano, M. Ono, Science 1991, 252, 691.
80. P. C. Cheng, D. M. Shinozaki, X-Ray Microscopy III (Eds.: A. G. Michette, G. R. Morrison, C. J. Buckley), Springer, Berlin 1992, p. 335.
81. K. Valiev, The Physics of Submicron Lithography, Plenum Press, New York 1992.
82. D. Seeger, IBM J. Res. Dev. 1993, 37, 435.
83. I. Haller, R. Feder, M. Hatzakis, E. Spiller, J. Electrochem. Soc. 1997, 126, 154.
84. E. Spiller, R. Feder, Topics Appl. Phys. 1977, 22, 35.
85. D. M. Shinozaki, X-Ray Microscopy II (Eds.: D. Sayre, M. Howells, J. Kirz, H. Rarback), Springer Series in Optical Sciences, Vol. 56, Springer, Berlin 1987, p. 118.
86. L. Y. Huang, Z. Phys. 1957, 149, 225.
87. F. Polack, S. Lowenthal, X-Ray Microscopy (Eds.: G. Schmahl, D. Rudolph), Springer Series in Optical Sciences, Vol. 43, Springer, Berlin 1984, p. 251.
88. F. Polack, S. Lowenthal, D. Phalippou, P. Fournet, X-Ray Microscopy II (Eds.: D. Sayre, M. Howells, J. Kirz, H. Rarback), Springer Series in Optical Sciences, Vol. 56, Springer, Berlin 1987, p. 220.
89. K. Kinoshita, T. Matsumura, Y. Inagaki, N. Hirai, M. Sugiyama, H. Kihara, N. Watanabe, Y. Shimanuki, A. Yagashita, X-Ray Microscopy III (Eds.: A. G. Michette, G. R. Morrison, C. J. Buckley), Springer Series in Optical Sciences, Vol. 67, Springer, Berlin 1992, p. 335.
90. B. L. Henke, J. P. Knauer, K. Premaratne, J. Appl. Phys. 1981, 52, 1509.
91. G. W. Fraser, Nucl. Instrum. Methods A 1985, 228, 532.
92. A. Akkerman, A. Gibrekhterman, A. Breskin, R. Chechik, J. Appl. Phys. 1992, 72, 5429.
93. W. Mullion, Diploma Thesis, Tübingen University 1993.
94. A. Recknagel, Z. Phys. 1941, 117, 689.
95. R. Castaing, L. Henry, C. R. Acad. Sci. Paris 1963, B255, 76.
96. S. Lanio, H. Rose, D. Krahl, Optik 1986, 73, 56.
97. G. W. Fraser, Nucl. Instrum. Methods 1984, 221, 115.
98. G. W. Fraser, Nucl. Instrum. Methods 1983, 206, 251, 265.
99. S. M. Grüner, Rev. Sci. Instrum. 1989, 60, 1545.
100. W. Hartmann, Topics Appl. Phys. 1977, 22, 191.
101. R. Nishida, S. Okamoto, Rep. Res. Inst. Electron., Shizuoka University 1966, 1, 21, 185.
102. D. H. Lump, G. R. Hopkinson, A. Wells, Nucl. Instrum. Methods A 1984, 221, 150.
103. N. M. Allinson, D. W. E. Allsop, J. A. Quayle, B. G. Magorrian, Nucl. Instrum. Methods A 1991, 310, 267.
104. P. Burstein, J. M. Davis, X-Ray Microscopy (Eds.: G. Schmahl, D. Rudolph), Springer Series in Optical Sciences, Vol. 43, Springer, Berlin 1984, p. 184.
105. R. Germer, W. Meyer-Use, Rev. Sci. Instrum. 1986, 57, 426.
106. C. Castelli, A. Wells, K. McCarthy, A. Holland, Nucl. Instrum. Methods A 1991, 310, 240.
107. J. L. Culhane, Nucl. Instrum. Methods A 1991, 310, 1.