The S-state model: A work horse for HRTEM

Ultramicroscopy

Volumn 93, Issue 3-4, 2002, Pages 179-198

  Geuens, P ^a   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Electron diffraction and elastic scattering theory; High resolution transmission electron microscopy (HRTEM); Image simulation

Indexed keywords

CRYSTAL DEFECTS; CRYSTALS; EIGENVALUES AND EIGENFUNCTIONS;

ELECTROSTATIC POTENTIAL;

ELECTRON SCATTERING;

SILICON;

ACCURACY; ARTICLE; CALCULATION; DYNAMICS; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE; MODEL; QUANTUM MECHANICS; TRANSMISSION ELECTRON MICROSCOPY; VALIDATION PROCESS;

EQUUS CABALLUS;

EID: 0036891364     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00276-0     Document Type: Article

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