Subsurface damage in optical substrates

Optik

Volumn 116, Issue 6, 2005, Pages 288-294

  Shen, Jian ^a,b   Liu, Shouhua ^c   Yi, Kui ^a   He, Hongbo ^a   Shao, Jianda ^a   Fan, Zhengxiu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Laser induced damage threshold; Optical thin film; Subsurface damage; Subsurface defect

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; ETCHING; GRINDING (MACHINING); LASER DAMAGE; LIGHT POLARIZATION; LIGHT SCATTERING; MICROSCOPIC EXAMINATION; OPTICAL FILMS; OPTICAL RESOLVING POWER; POLISHING; SUBSTRATES; THIN FILMS;

LASER-INDUCED DAMAGE THRESHOLD; LASER-INDUCED DAMAGE THRESHOLD (LIDT); OPTICAL THIN FILMS; SUBSURFACE DAMAGE; SUBSURFACE DEFECT;

OPTICAL MATERIALS;

EID: 20444411483     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2005.02.002     Document Type: Article

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