Measurement of subsurface defect shape by photoacoustic microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 5 B, 2002, Pages 3361-3362

  Endoh, Haruo ^a   Miyamoto, Katsuhiko ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

Defect shape; NDE; PA imaging; Photoacoustic microscopy (PAM); Subsurface defect

Indexed keywords

ACOUSTIC IMAGING; ACOUSTIC WAVE PROPAGATION; MICROSCOPIC EXAMINATION; PHOTOACOUSTIC SPECTROSCOPY; SPATIAL VARIABLES MEASUREMENT; SURFACES; THERMAL DIFFUSION IN SOLIDS;

PHOTOACOUSTIC MICROSCOPY; PHOTOACOUSTIC SIGNAL INTENSITY DISTRIBUTION; SUBSURFACE DEFECT SHAPE;

DEFECTS;

EID: 0036578507     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.3361     Document Type: Article

References (7)