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Volumn 33, Issue 9, 2000, Pages 611-621

Surface and subsurface damages and magnetic recording pattern degradation induced by indentation and scratching

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEGRADATION; ELASTICITY; FAILURE ANALYSIS; INDENTATION; MAGNETIC DISK STORAGE; MAGNETIC HEADS; MAGNETIC RECORDING; MAGNETIC THIN FILMS; MULTILAYERS; PLASTIC DEFORMATION; STRESS ANALYSIS;

EID: 0034265065     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0301-679X(00)00077-3     Document Type: Article
Times cited : (18)

References (12)
  • 1
    • 0000701680 scopus 로고    scopus 로고
    • Load/unload technology in disk drives
    • Albrecht T.R., Sai F. Load/unload technology in disk drives. IEEE Trans. Mag. 35:1999;857-862.
    • (1999) IEEE Trans. Mag. , vol.35 , pp. 857-862
    • Albrecht, T.R.1    Sai, F.2
  • 3
    • 0032117079 scopus 로고    scopus 로고
    • Potential data loss due to head/disk contacts during dynamic load/unload
    • Suk M., Jen D. Potential data loss due to head/disk contacts during dynamic load/unload. IEEE Trans. Mag. 34:1998;1711-1713.
    • (1998) IEEE Trans. Mag. , vol.34 , pp. 1711-1713
    • Suk, M.1    Jen, D.2
  • 4
    • 0025596012 scopus 로고
    • A model for the mechanical stresses induced by head-disk contact
    • Keremes J.J., Sinclair G.B. A model for the mechanical stresses induced by head-disk contact. Int. J. Solids Structures. 26:1990;417-435.
    • (1990) Int. J. Solids Structures , vol.26 , pp. 417-435
    • Keremes, J.J.1    Sinclair, G.B.2
  • 5
    • 0029273748 scopus 로고
    • Demagnetization due to inverse magnetostriction effects in longitudinal thin film media
    • Jeong T.G., Bogy D. Demagnetization due to inverse magnetostriction effects in longitudinal thin film media. IEEE Trans. Mag. 31:1995;1007-1012.
    • (1995) IEEE Trans. Mag. , vol.31 , pp. 1007-1012
    • Jeong, T.G.1    Bogy, D.2
  • 6
    • 0033279441 scopus 로고    scopus 로고
    • The physical effects of intradrive particulate contamination on the head-disk interface in hard-disk drives
    • Altshuler K.J., Harrison J.C., Ackerman E. The physical effects of intradrive particulate contamination on the head-disk interface in hard-disk drives. J. Trib. 121:1999;352-357.
    • (1999) J. Trib. , vol.121 , pp. 352-357
    • Altshuler, K.J.1    Harrison, J.C.2    Ackerman, E.3
  • 7
    • 0001366436 scopus 로고    scopus 로고
    • Particle induced damage on heads and discs due to fine particles of different materials
    • Zhang L., Koka R., Yeun Y., Lam E. Particle induced damage on heads and discs due to fine particles of different materials. IEEE Trans. Mag. 35:1999;927-932.
    • (1999) IEEE Trans. Mag. , vol.35 , pp. 927-932
    • Zhang, L.1    Koka, R.2    Yeun, Y.3    Lam, E.4
  • 10
    • 0032312045 scopus 로고    scopus 로고
    • The use of micromechanical techniques, AFM and MFM to assess surface damage in multilayered thin films
    • Wu T.T., Frommer J. The use of micromechanical techniques, AFM and MFM to assess surface damage in multilayered thin films. Mat. Res. Soc. Symp. Proc. 522:1998;287-292.
    • (1998) Mat. Res. Soc. Symp. Proc. , vol.522 , pp. 287-292
    • Wu, T.T.1    Frommer, J.2
  • 11
    • 84971928468 scopus 로고
    • Measurement of thin film mechanical properties using nanoindentation
    • Pharr G.M., Oliver W.C. Measurement of thin film mechanical properties using nanoindentation. Mat. Res. Soc. Bull. July. 17:1992;28-33.
    • (1992) Mat. Res. Soc. Bull. July , vol.17 , pp. 28-33
    • Pharr, G.M.1    Oliver, W.C.2
  • 12
    • 0032653777 scopus 로고    scopus 로고
    • Finite element analysis on local yield map and critical maximum contact pressure for yield in hard coating with an interlayer under sliding contact
    • Diao D.F. Finite element analysis on local yield map and critical maximum contact pressure for yield in hard coating with an interlayer under sliding contact. Trib. Int. 32:1999;25-32.
    • (1999) Trib. Int. , vol.32 , pp. 25-32
    • Diao, D.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.