Laser modulated scattering as a nondestructive evaluation tool for defect inspection in optical materials for high power laser applications

Optics Express

Volumn 3, Issue 10, 1998, Pages 376-383

  Wu, Z L ^a   Sheehan, L ^a   Kozlowski, M R ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; HEAT CONDUCTION; LASER APPLICATIONS; LASER DAMAGE; LIGHT ABSORPTION; LIGHT MODULATION; LIGHT SCATTERING; NONDESTRUCTIVE EXAMINATION; SILICA;

DARK-FIELD PHOTOTHERMAL MICROSCOPY; LASER MODULATED SCATTERING (LMS); OPTICAL BEAM DEFLECTION; PHOTOTHERMAL EFFECTS;

OPTICAL MATERIALS;

EID: 4043116247     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.3.000376     Document Type: Article

References (16)

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