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Volumn 34, Issue 4, 2005, Pages 409-415

Properties of phosphorus-doped (Zn,Mg)O thin films and device structures

Author keywords

(Zn,Mg)O; Phosphorus doped; Wide bandgap semiconductor; Zinc oxide

Indexed keywords

ANNEALING; BAND STRUCTURE; CARRIER CONCENTRATION; DOPING (ADDITIVES); GALLIUM NITRIDE; MAGNESIUM PRINTING PLATES; OPTOELECTRONIC DEVICES; PHOSPHORUS; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; ZINC OXIDE;

EID: 18244391186     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0120-7     Document Type: Conference Paper
Times cited : (19)

References (45)
  • 41
    • 18244379483 scopus 로고    scopus 로고
    • Y.W. Kwon, M. Jones, Y. Li, Y.W. Heo, and D.P. Norton, in preparation
    • Y.W. Kwon, M. Jones, Y. Li, Y.W. Heo, and D.P. Norton, in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.