Synchrotron radiation micro-X-ray fluorescence analysis: A tool to increase accuracy in microscopic analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 375-381

  Adams, F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Microanalysis; Synchrotron X ray analysis; Traceability

Indexed keywords

FLUORESCENCE; MICROANALYSIS; POLARIZATION; X RAYS;

X-RAY FLUORESCENCE (XRF);

SYNCHROTRON RADIATION;

EID: 0037243217     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01563-X     Document Type: Conference Paper

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11. F. Adams, in: R.A. Meyers (Ed.), Encyclopedia of Analytical Chemistry, Vol. 15, John Wiley & Sons Ltd., Chichester, UK, p. 13636.
12. L. Kempenaers, private communication.