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Volumn 9, Issue 1, 2002, Pages 223-232

XPEEM with energy-filtering: Advantages and first results from the SMART project

(18) Schmidt, Th a Groh, U a Fink, R a Umbach, E a Schaff, O b Engel, W b Richter, B b Kuhlenbeck, H b Schlogl R b Freund, H J b Bradshaw, A M b Preikszas, D c Hartel, P c Spehr, R c Rose, H c Lilienkamp, G d Bauer, E d,e Benner, G f

a UNIVERSITY OF WÜRZBURG (Germany)

b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT (Germany)

c DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

d CLAUSTHAL UNIVERSITY OF TECHNOLOGY (Germany)

e ARIZONA STATE UNIVERSITY (United States)

f LEO Elektronenmikroskopie GmbH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; ELECTRON DIFFRACTION; ENERGY; FILTER; MICROSCOPY; OPTICAL RESOLUTION; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036462868 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X02001811 Document Type: Conference Paper

Times cited : (91)

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