A new approach to nuclear microscopy: The ion-electron emission microscope

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 158, Issue 1-4, 1999, Pages 6-17

  Doyle, B L ^a   Vizkelethy, G ^a,d   Walsh, D S ^a   Senftinger, B ^b   Mellon, M ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Staib Instrumente GmbH   (Germany)

^c Quantar Technology Inc   (United States)

^d IDAHO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON MICROSCOPY; ION BEAMS; PROBES; RADIATION EFFECTS;

ION BEAM ANALYSIS; ION BEAM INDUCED CHARGE COLLECTION (IBICC); ION ELECTRON EMISSION MICROSCOPY (IEEM); NUCLEAR MICROPROBE ANALYSIS (NMA);

ION MICROSCOPES;

EID: 0033338226     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00312-2     Document Type: Article

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