Ion-induced emmision microscopies

Current Applied Physics

Volumn 3, Issue 1, 2003, Pages 31-34

  Doyle, B L ^a   Walsh, D S ^a   Vizkelethy, G ^a   Rossi, P ^b   McDaniel, F D ^c   Schenkel, T ^d   McDonald, J ^e   Hamza, A V ^e  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF NORTH TEXAS   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Emission microscopy; Nuclear microscopy; Radiation effects

Indexed keywords

EID: 0037323061     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1567-1739(02)00231-6     Document Type: Article

References (5)

1. B.L. Doyle, D.S. Walsh, S.N. Renfrow, G. Vizkelethy, T. Schenkel, A.V. Hamza, Nucl. Instrum. Methods B 181 (2001) 199-210.
2. B.L. Doyle, G. Vizkelethy, D.S. Walsh, B. Senftinger, M. Mellon, Nucl. Instrum. Methods B 158 (1999) 6.
3. B.L. Doyle, G. Vizkelethy, D.S. Walsh, D. Swenson, Nucl. Instrum. Methods B 190 (2002) 19.
4. A.V. Hamza, A.V. Barnes, E. Magee, M. Newman, T. Schenkel, J.W. McDonald, D.H. Schneider, Highly charged ion based time-of-flight emission microscope, Rev. Sci. Instrum. 71 (2000) 2077.
5. P. Rossi, B.L. Doyle, J.A.Banks, A. Battistella, G. Gennaro, F.D. McDaniel, M. Mellon, E. Vittone, G. Vizkelethy, N.D. Wing, in: Proceedings International Conference of Nuclear Microprobe Techniques and Analysis, September 2002.