Cation mass spectrometer: Towards an optimisation of MCs x + cluster analysis

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 189-193

  Wirtz, T ^a   Migeon, H N ^a   Scherrer, H ^b  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^b INSTITUT JEAN LAMOUR   (France)

Author keywords

Cesium clusters; Cesium concentration; Cs Ga co bombardment; Useful yield

Indexed keywords

ION BEAMS; ION BOMBARDMENT; IONIZATION; MASS SPECTROMETERS; OPTIMIZATION; POSITIVE IONS; PROBABILITY;

CLUSTER ANALYSIS;

CESIUM;

EID: 12244295147     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00622-0     Document Type: Conference Paper

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