Low-Energy Electron Microscopy of Surface Phase Transitions

Annual Review of Materials Research

Volumn 33, Issue , 2003, Pages 263-288

  Hannon, James B ^a   Tromp, Ruud M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Faceting; LEEM; Phase coexistence; Roughening

Indexed keywords

ELECTRON MICROSCOPY; IMAGE ANALYSIS; REAL TIME SYSTEMS; SURFACE REACTIONS; THERMODYNAMICS;

PHASE COEXISTENCE;

PHASE TRANSITIONS;

EID: 0041779851     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.33.121901.111743     Document Type: Review

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