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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 199-210

Nuclear emission microscopies

(6) Doyle, B L a Walsh, D S a Renfrow, S N a,b Vizkelethy, G a Schenkel, T c Hamza, A V d

a SANDIA NATIONAL LABORATORIES (United States)

b Mission Research Corporation (United States)

c LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

d LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

Author keywords

Highly charged ion secondary ion mass spectroscopy; Ion electron emission microscopy; Ion photon emission microscopy; Nuclear emission microscopy

Indexed keywords

ELECTRON MICROSCOPY; ION BEAMS; NUCLEAR RADIATION SPECTROSCOPY; PARTICLE DETECTORS; PROBES; SECONDARY EMISSION;

HIGHLY CHARGED ION-SECONDARY ION MASS SPECTROSCOPY (HCI-SIMS); ION ELECTRON EMISSION MICROSCOPY (IEEM);

NUCLEAR PHYSICS;

EID: 0035387796 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(01)00535-3 Document Type: Conference Paper

Times cited : (19)

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