Development of a C 60 + ion gun for static SIMS and chemical imaging

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 219-222

  Wong, S C C ^a   Hill, R ^b   Blenkinsopp, P ^b   Lockyer, N P ^a   Weibel, D E ^a   Vickerman, J C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b IONOPTIKA LTD   (United Kingdom)

Author keywords

C 60; Ga; Ion source; Polyatomic; SSIMS

Indexed keywords

FULLERENES; IMAGING TECHNIQUES; ION BEAMS; POLYMERS; SECONDARY ION MASS SPECTROMETRY; THIN FILMS;

CHEMICAL IMAGING;

ION SOURCES;

EID: 1542335220     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00629-3     Document Type: Conference Paper

References (4)

1. Kötter F., Benninghoven A. Appl. Surf. Sci. 133:1998;47.
2. Van Stipdonk M.J., Harris R.D., Schweikert E.A. Rapid Commun. Mass Spectrom. 10:1996;1987.
3. Braun R.M., Blenkinsopp P., Mullock S.J., Corlett C., Willey K.F., Vickerman J.C., Winograd N. Rapid Commun. Mass Spectrom. 12:1998;1246.
4. S.C.C. Wong, D.E. Weibel, N.P. Lockyer, R. Hill, P. Blenkinsopp, J.C. Vickerman, in preparation.