Statistical timing analysis using bounds and selective enumeration

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 22, Issue 9, 2003, Pages 1243-1260

  Agarwal, Aseem ^a   Zolotov, Vladimir ^b   Blaauw, David T ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b MOTOROLA INC   (United States)

Author keywords

Probability; Process variation; Statistical analysis; Yield prediction

Indexed keywords

DELAY CIRCUITS; HEURISTIC METHODS; ITERATIVE METHODS; NUMERICAL METHODS; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS; TIME DOMAIN ANALYSIS;

RUN TIME COMPLEXITY; STATISTICAL TIMING ANALYSIS; YIELD PREDICTION;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0141852377     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.816217     Document Type: Article

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