Getting to the bottom of deep submicron

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 203-211

  Sylvester, Dennis ^a   Keutzer, Kurt ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL GEOMETRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MODELS;

DEEP SUBMICRON (DSM);

INTEGRATED CIRCUIT LAYOUT;

EID: 0032307685     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.288614     Document Type: Conference Paper

References (33)