Noise in deep submicron digital design

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 524-531

  Shepard, Kenneth L ^a   Narayanan, Vinod ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; LARGE SCALE SYSTEMS; SPURIOUS SIGNAL NOISE; VLSI CIRCUITS;

DEEP SUBMICRON DIGITAL DESIGN; NOISE IMMUNITY; NOISE STABILITY; STATIC NOISE ANALYSIS;

LOGIC DESIGN;

EID: 0030403625     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)