Uncertainty-Aware circuit optimization

Proceedings - Design Automation Conference

Volumn , Issue , 2002, Pages 58-63

  Bai, Xiaoliang ^a   Visweswariah, Chandu ^b   Strenski, Philip N ^b   Hathaway, David J ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM MICROELECTRONICS   (United States)

Author keywords

Circuit tuning; Nonlinear optimization; Performance optimization; Process variation; Transistor sizing; Uncertainty

Indexed keywords

NONLINEAR CIRCUIT OPTIMIZATION;

ALGORITHMS; CONSTRAINT THEORY; NONLINEAR SYSTEMS; OPTIMIZATION; RELIABILITY; STATISTICAL METHODS; TRANSISTORS; TUNING; UNCERTAIN SYSTEMS;

DIGITAL CIRCUITS;

EID: 0036054545     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2002.1012594     Document Type: Article

References (16)

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