Short channel epi-MOSFET model

IEEE Transactions on Electron Devices

Volumn 47, Issue 12, 2000, Pages 2372-2378

  Suzuki, Kunihiro ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

Epi mosfet; Scaling theory; Short channel effects

Indexed keywords

EID: 0041346978     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.887024     Document Type: Article

References (33)

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