Surface evolution in bare bamboo-type metal lines under diffusion and electric field effects

Journal of Computational Physics

Volumn 188, Issue 2, 2003, Pages 640-677

  Averbuch, Amir ^a   Israeli, Moshe ^b   Nathan, Menachem ^a   Ravve, Igor ^c  

^a TEL AVIV UNIVERSITY   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAMBOO; DIFFUSION; ELECTRIC LINES; ELECTROMIGRATION; MICROELECTRONICS; RUNGE KUTTA METHODS; SAILING VESSELS;

DIFFUSION MODEL; EXTERNAL ELECTRIC FIELD; INITIAL DEFECTS; METAL LINE; MODELING RESULTS; MULLINS; ONE-DIMENSIONAL; SURFACE EVOLUTION; TOP SURFACE; VOLTAGE DISTRIBUTION;

BOUNDARY ELEMENT METHOD;

EID: 0038350308     PISSN: 00219991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-9991(03)00199-2     Document Type: Article

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