Diffuse interface model for electromigration and stress voiding

Journal of Applied Physics

Volumn 87, Issue 4, 2000, Pages 1712-1721

  Bhate, Deepali N ^a   Kumar, Ashish ^a   Bower, Allan F ^a  

^a Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001336786     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372082     Document Type: Article

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