Current density and line width effects in electromigration: A new damage-based lifetime model

Acta Materialia

Volumn 46, Issue 11, 1998, Pages 3733-3743

  Kraft, O ^a   Arzt, E ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012941592     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(97)00245-0     Document Type: Article

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