A theoretical treatment of void electromigration in the strip geometry

Computational Materials Science

Volumn 17, Issue 2-4, 2000, Pages 279-289

  Ben Amar, M ^a   Cummings, L J ^a   Richardson, G ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038413121     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0256(00)00039-2     Document Type: Article

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