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Volumn 59, Issue 16, 1999, Pages 11037-11046

Simulations and theory of electromigration-induced slit formation in unpassivated single-crystal metal lines

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EID: 0001761870     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.11037     Document Type: Article
Times cited : (96)

References (48)
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    • (1986) Rev. Mod. Phys. , vol.58 , pp. 977
    • Bensimon, D.1    Kadanoff, L.P.2    Liang, S.3    Shraiman, B.I.4    Tang, C.5
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    • E. Arzt, O. Kraft, and U. E. Möckl, in Materials Research in Microelectronics IV, edited by P. Børgesen et al., MRS Symp. Proc. No. 338 (Materials Research Society, Pittsburgh, 1994), p. 397.
    • (1994) MRS Symp. Proc. , pp. 397
    • Arzt, E.1    Kraft, O.2    Möckl, U.E.3
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    • (private communication).
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    • M. Primicero, Vol. 2 of Research Notes in Mathematics, Pitman, New York A. Fasano
    • G. Fix, in Free Boundary Problems, edited by A. Fasano and M. Primicero, Vol. 2 of Research Notes in Mathematics (Pitman, New York, 1983).
    • (1983) Free Boundary Problems
    • Fix, G.1
  • 38
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    • We have carried out extensive tests with smaller values of (Formula presented) for the test case of a drifting circular void. Using values as small as (Formula presented), we found that the drift velocity of the void changed by less than 2%.
    • We have carried out extensive tests with smaller values of (Formula presented) for the test case of a drifting circular void. Using values as small as (Formula presented), we found that the drift velocity of the void changed by less than 2%.


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