Effects of alloying elements on electromigration

Microelectronics Reliability

Volumn 38, Issue 6-8, 1998, Pages 1015-1020

  Spolenak, R ^a   Kraft, O ^a   Arzt, E ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ALUMINUM ALLOYS; ELECTROMIGRATION; MATHEMATICAL MODELS;

MECHANISTIC MODELS;

ALLOYING ELEMENTS;

EID: 0032084084     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00110-3     Document Type: Article

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