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Volumn 90, Issue 3, 2001, Pages 1564-1572

Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035424075     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1382835     Document Type: Article
Times cited : (29)

References (32)
  • 8
    • 0347145148 scopus 로고    scopus 로고
    • O. Uysal, M.Sc. thesis, Middle East Technical University, 2000
    • O. Uysal, M.Sc. thesis, Middle East Technical University, 2000.
  • 10
    • 0345884008 scopus 로고
    • edited by J. H. Hollomon American Society for Metals, Cleveland, Ohio
    • J. Bardeen and C. Herring, Atom Movements, edited by J. H. Hollomon (American Society for Metals, Cleveland, Ohio, 1951), p. 93.
    • (1951) Atom Movements , pp. 93
    • Bardeen, J.1    Herring, C.2
  • 23
    • 0346514819 scopus 로고    scopus 로고
    • E. E. Oren, M.Sc. thesis, Middle East Technical University, 2000
    • E. E. Oren, M.Sc. thesis, Middle East Technical University, 2000.
  • 26
    • 0347145147 scopus 로고    scopus 로고
    • A. L. Greer, http://www.msm.cam.ac.uk/mkg/e_mig.html.
    • Greer, A.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.