Analysis of integrated single-electron memory operation

Journal of Applied Physics

Volumn 92, Issue 12, 2002, Pages 7291-7295

  Korotkov, Alexander N ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; ELECTRIC CHARGE; ELECTRON DEVICE TESTING; ELECTRON TUNNELING;

SINGLE-ELECTRON MEMORY;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0037115446     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1521788     Document Type: Article

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