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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 11, 2002, Pages 1153211-1153218

STM study of the C-induced Si(100)-c (4 × 4) reconstruction

(4) Jemander, S T a Zhang, H M a Uhrberg, R I G a Hansson, G V a

a LINKÖPING UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; SILICON;

ARTICLE; AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; ELECTRON DIFFRACTION; IMAGE ANALYSIS; MODEL; PHYSICS; RELIABILITY; SCANNING TUNNELING MICROSCOPY;

EID: 0037088199 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (27)

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