Surface morphology and reconstructions of ultra thin Si films grown by solid-phase epitaxy

Thin Solid Films

Volumn 294, Issue 1-2, 1997, Pages 88-92

  Zhang, Z ^a   Kulakov, M A ^a   Bullemer, B ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Epitaxy; Scanning tunnelling microscopy; Silicon; Surface morphology

Indexed keywords

EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE; ULTRATHIN FILMS;

SOLID PHASE EPITAXY; SURFACE MORPHOLOGY;

SEMICONDUCTING SILICON;

EID: 0031073605     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09253-X     Document Type: Article

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