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Volumn 440, Issue 3, 1999, Pages 351-356

Surface reconstructions of the Si(100)-Ge system

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHEMICAL VAPOR DEPOSITION; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GERMANIUM; SEMICONDUCTOR GROWTH; SURFACE ACTIVE AGENTS; SURFACE ROUGHNESS;

EID: 0033363627     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00842-0     Document Type: Article
Times cited : (6)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.